27/04/2018 - 8th CS International conference for compound semiconductors

On 10th-11th April 2018 the Platform for Advanced Characterisation – Grenoble (PAC-G) has been at the 8th CS International conference build on the success of its predecessors, with industry-leading insiders delivering more than 30 presentations spanning five sectors. On this occasion the PAC-G showed the advantages applications of neutron and synchrotron x-ray for the compound semiconductor industry and the case study on « GaN crystal defects to improve the performance of semiconductor devices – Synchrotron X-ray imaging ».

They case study is available only by this link: https://goo.gl/VcL8Uz